Material Characterization
Advanced material insights that reveal composition, behavior, and performance‑driving properties
Material Characterization Capabilities
Material characterization helps you understand what a material is, how it behaves, and why it performs the way it does. Whether you’re troubleshooting product failures, optimizing performance, or validating quality across industries—manufacturing, food & beverage, pharmaceuticals, and more, our testing services reveal the hidden properties that drive real-world results. From identifying defects to guiding process improvements, we provide the insights needed for quick problem-solving and informed decision-making.
- Material/Containment Identification
- Gas, Soil, Water, Pollutant Analysis
- Raw Materials Analysis
- Elemental Composition
- Reaction Monitoring & Mechanistic Studies
- Film/Coating Identification
- Food & Beverage Adulteration Detection/Label Authenticity
- Polymer Typing B Dehydration Analysis
Material Characterization Testing
At Gillson Sciences, we offer a range of material characterization techniques to meet our clients' diverse needs. Our methods deliver accurate, reproducible measurements for research, quality control, and regulatory compliance.
Fourier - Transform Infrared Spectroscopy (FTIR)
Fourier-Transform Infrared Spectroscopy enables rapid identification of non-IR reflective materials by analyzing the stretching of molecular bands caused by infrared light absorption, with the resulting spectrum of a given material serving as a molecular fingerprint. Our team uses FTIR to confirm material identity, detect contaminants, compare unknowns to reference libraries, and support root‑cause investigations across polymers, coatings, pharmaceuticals, food products, and more. With both qualitative and semi‑quantitative analysis capabilities, FTIR provides fast, reliable insight into what a material is and how its chemical structure influences performance.
Scanning Electron Microscopy with Energy Dispersive X‑ray Spectroscopy (SEM/EDS)
Scanning Electron Microscopy provides high‑resolution imaging to reveal surface topography and defects at the nanoscale. Accompanying Energy-Dispersive X-ray Spectroscopy provides elemental analysis to explore material composition at the microscale. This technique allows us to characterize morphology, identify contaminants or inclusions, map elemental distribution, and support failure investigations across metals, polymers, coatings, and complex assemblies. By combining detailed imaging with precise chemical data, SEM/EDS delivers the clarity needed to understand how structure and composition influence performance.
Optical Microscopy
Optical Microscopy provides detailed visual examination of materials, surfaces, and defects at magnifications ideal for assessing morphology, particle size, surface features, and early‑stage failures. Using both brightfield and polarized light techniques, we evaluate contaminants, inclusions, coatings, and structural irregularities to support characterization, comparison, and quality assessments across a wide range of materials. This method offers fast, reliable insight into visible‑level characteristics that often guide deeper analytical testing.
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